DocumentCode
242145
Title
Efficient pattern generation for transition-fault diagnosis using combinational circuit model
Author
Yi-Da Wang ; Kuen-Jong Lee
Author_Institution
Dept. of EE, Nat. Cheng Kung Univ., Tainan, Taiwan
fYear
2014
fDate
28-31 Oct. 2014
Firstpage
1
Lastpage
4
Abstract
An efficient diagnosis procedure to distinguish non-equivalent transition faults and identify equivalent transition faults is proposed. This procedure consists of three main methods. The Fault Inactivation Method (FIM) generates diagnosis patterns to distinguish fault pairs by inactivating one fault and detecting the other for each fault pair, the Fault Pair Filter Method (FPF) quickly identifies a large portion of equivalent-fault pairs after FIM, and the Fault Propagation Method (FPM) generates diagnosis patterns for the remaining distinguishable fault pairs and identifies equivalent-fault pairs by initializing both faults in each pair simultaneously and creating distinguishable faulty responses. Experimental results show that only 6 out of more than 7.48*108 fault pairs in ISCAS89 benchmark circuits cannot be handled by this method, i.e., a diagnosis resolution of higher than 99.999999%is achieved.
Keywords
automatic test pattern generation; combinational circuits; fault diagnosis; integrated circuit testing; logic testing; ISCAS89 benchmark circuits; combinational circuit model; fault inactivation method; fault pair filter method; fault propagation method; nonequivalent transition faults; transition-fault diagnosis; Circuit analysis; Circuit faults; Fault diagnosis; Gold;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4799-3296-2
Type
conf
DOI
10.1109/ICSICT.2014.7021499
Filename
7021499
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