• DocumentCode
    2421480
  • Title

    Raytheon ferroelectric thin film development consortium

  • Author

    Bernacki, Stephen E.

  • Author_Institution
    Raytheon Co., Sudbury, MA, USA
  • fYear
    1989
  • fDate
    12-14 Jun 1989
  • Firstpage
    30
  • Lastpage
    34
  • Abstract
    Raytheon Company has formed a joint industry-government-university research and development consortium to exploit the recent rapid advancements in ferroelectric thin-film ceramic technology for nonvolatile digital integrated circuit memory application. The ferroelectric thin-film consortium is a comparative study of materials composition and deposition techniques. To achieve a uniform comparison across the various deposition techniques, Raytheon prepares all sample substrates and distributes them to the member laboratories for film deposition of their choice. The samples are then returned to Raytheon for physical characterization (scanning electron microscopy, electron spectroscopy for chemical analysis, X-ray diffraction, Auger, etc.) and electrical characterization (breakdown voltage, switching voltage, stored charge, fatigue, etc.) of capacitors formed by the deposition of top electrodes sputtered on the films. The author describes the structure and operation of the consortium, as well as the participants and their respective deposition expertise, and briefly reports on technical progress to date
  • Keywords
    ceramics; ferroelectric thin films; research and development management; research initiatives; Auger spectroscopy; ESCA; Raytheon; X-ray diffraction; breakdown voltage; capacitors; deposition techniques; electrical characterization; fatigue; ferroelectric thin-film ceramic technology; industry-government-university research and development consortium; materials composition; nonvolatile digital integrated circuit memory; physical characterization; scanning electron microscopy; stored charge; switching voltage; Ceramics industry; Digital integrated circuits; Electrons; Ferroelectric materials; Integrated circuit technology; Nonvolatile memory; Research and development; Sputtering; Thin film circuits; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    University/Government/Industry Microelectronics Symposium, 1989. Proceedings., Eighth
  • Conference_Location
    Westborough, MA
  • ISSN
    0749-6877
  • Type

    conf

  • DOI
    10.1109/UGIM.1989.37293
  • Filename
    37293