DocumentCode :
2421552
Title :
2000 5th international workshop on statistical metrology [front matter]
fYear :
2000
fDate :
10-10 June 2000
Abstract :
Conference proceedings front matter may contain various advertisements, welcome messages, committee or program information, and other miscellaneous conference information. This may in some cases also include the cover art, table of contents, copyright statements, title-page or half title-pages, blank pages, venue maps or other general information relating to the conference that was part of the original conference proceedings.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Statistical Metrology, 2000 5th International Workshop on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-5896-1
Type :
conf
DOI :
10.1109/IWSTM.2000.869308
Filename :
869308
Link To Document :
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