Title :
Analysis of RF impairments on EVM performance of the OFDM PHY of IEEE 802.11ad standard
Author :
Jin Qin ; Lei Zhang ; Li Zhang ; Yan Wang ; Zhiping Yu
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
Abstract :
The paper presents a system-level simulation platform supporting both top-down and bottom-up design and verifications based on 802.11ad standard, and EVM degradation on the OFDM PHY due to various RF impairments, such as LO phase noise, PA nonlinearity, I/Q mismatch, and ADC/DAC resolution are simulated and elaborated. The platform has been verified based on the EVM comparison between simulation and measured results. This work provides RF designers with comprehensive system-level and circuit-level overviews of 802.11ad RF transceivers for Gbps wireless communications on a pre-silicon base.
Keywords :
OFDM modulation; radio transceivers; wireless LAN; 802.11ad RF transceivers; ADC/DAC resolution; EVM performance; Gbps wireless communications; I/Q mismatch; IEEE 802.11ad standard; LO phase noise; OFDM PHY; PA nonlinearity; RF impairment analysis; circuit level overviews; comprehensive system level; presilicon base; system level simulation platform; Abstracts; Noise; OFDM; Phase shift keying; Radio frequency; Wireless communication;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4799-3296-2
DOI :
10.1109/ICSICT.2014.7021513