Title :
Problems Encountered in High-Frequency Surface-Wave Devices
Author :
Williamson, R.C.
Keywords :
Attenuation; Frequency; Laboratories; Pattern recognition; Propagation losses; Rough surfaces; Surface acoustic wave devices; Surface roughness; Surface topography; Surface waves;
Conference_Titel :
1974 Ultrasonics Symposium
DOI :
10.1109/ULTSYM.1974.196345