DocumentCode
2421906
Title
The test vector problem and limitations to evolving digital circuits
Author
Imamura, Kosuke ; Foster, James A. ; Krings, Axel W.
Author_Institution
Dept. of Comput. Sci., Idaho Univ., Moscow, ID, USA
fYear
2000
fDate
2000
Firstpage
75
Lastpage
79
Abstract
How do we know the correctness of an evolved circuit? While Evolutionary Hardware is exhibiting its effectiveness, we argue that it is very difficult to design a large-scale digital circuit by conventional evolutionary techniques alone, if we are using a subset of the entire truth table for fitness evaluation. The test vector generation problem for testing VLSI (Very Large Scale Integration) suggests that there is no efficient way to determine a training set which assures full correctness of an evolved circuit
Keywords
VLSI; genetic algorithms; logic design; logic testing; VLSI; evolutionary techniques; evolving digital circuits; test vector generation problem; test vector problem; truth table; Application software; Circuit faults; Circuit testing; Computer science; Digital circuits; Evolutionary computation; Field programmable gate arrays; Hardware; Logic arrays; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Evolvable Hardware, 2000. Proceedings. The Second NASA/DoD Workshop on
Conference_Location
Palo Alto, CA
Print_ISBN
0-7695-0762-X
Type
conf
DOI
10.1109/EH.2000.869344
Filename
869344
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