• DocumentCode
    2422194
  • Title

    The IGBT failure mechanism research of DC plasma arc cutting inverter power when arc-starting

  • Author

    He, Liangzong ; Duan, Shanxu ; Liu, Baoqi ; Li, Xun ; Zhu, Guorong ; Luo, Xuexiao

  • Author_Institution
    Huazhong Univ. of Sci. & Technol., Wuhan, China
  • fYear
    2009
  • fDate
    17-20 May 2009
  • Firstpage
    1225
  • Lastpage
    1229
  • Abstract
    This paper presents a physicals process hypothesis about the IGBT failure in according to the complex physical phenomena of IGBT burned when high-frequency arc-starting, after the analysis of pulse-transformer mathematical model and IGBT mathematical model, the corresponding simulation models are established, combining the specific experiments, the results show that the hypothesis is correct and reasonable, then a more reliable drive circuit is designed. It gives certain guiding significance to reliability design of plasma cutting power or other powers.
  • Keywords
    arc cutting; driver circuits; insulated gate bipolar transistors; invertors; pulse transformers; DC plasma arc cutting inverter power; IGBT failure mechanism; IGBT mathematical model; drive circuit; high-frequency arc-starting; pulse-transformer mathematical model; Bridge circuits; Electromagnetic interference; Electromagnetic radiative interference; Failure analysis; Insulated gate bipolar transistors; Inverters; Mathematical model; Plasmas; Pulse circuits; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Motion Control Conference, 2009. IPEMC '09. IEEE 6th International
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-3556-2
  • Electronic_ISBN
    978-1-4244-3557-9
  • Type

    conf

  • DOI
    10.1109/IPEMC.2009.5157571
  • Filename
    5157571