DocumentCode :
2422194
Title :
The IGBT failure mechanism research of DC plasma arc cutting inverter power when arc-starting
Author :
He, Liangzong ; Duan, Shanxu ; Liu, Baoqi ; Li, Xun ; Zhu, Guorong ; Luo, Xuexiao
Author_Institution :
Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear :
2009
fDate :
17-20 May 2009
Firstpage :
1225
Lastpage :
1229
Abstract :
This paper presents a physicals process hypothesis about the IGBT failure in according to the complex physical phenomena of IGBT burned when high-frequency arc-starting, after the analysis of pulse-transformer mathematical model and IGBT mathematical model, the corresponding simulation models are established, combining the specific experiments, the results show that the hypothesis is correct and reasonable, then a more reliable drive circuit is designed. It gives certain guiding significance to reliability design of plasma cutting power or other powers.
Keywords :
arc cutting; driver circuits; insulated gate bipolar transistors; invertors; pulse transformers; DC plasma arc cutting inverter power; IGBT failure mechanism; IGBT mathematical model; drive circuit; high-frequency arc-starting; pulse-transformer mathematical model; Bridge circuits; Electromagnetic interference; Electromagnetic radiative interference; Failure analysis; Insulated gate bipolar transistors; Inverters; Mathematical model; Plasmas; Pulse circuits; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Motion Control Conference, 2009. IPEMC '09. IEEE 6th International
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-3556-2
Electronic_ISBN :
978-1-4244-3557-9
Type :
conf
DOI :
10.1109/IPEMC.2009.5157571
Filename :
5157571
Link To Document :
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