DocumentCode :
2422213
Title :
The impact of thermal cycling in humid environments on power electronic modules
Author :
Wang, Ningyan ; Cotton, I. ; Evans, K.
Author_Institution :
Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester, UK
fYear :
2009
fDate :
17-20 May 2009
Firstpage :
1235
Lastpage :
1241
Abstract :
The reliable operation of power electronic modules operating at high voltage is essential. The dielectric system within the power electronic module is reasonably simple but must be worked as hard as possible to achieve the highest module power densities. It is well known that a critical location in a power electronic module in terms of high voltage performance is the edge of the substrate metallisation where high electric fields can give rise to partial discharge within power electronic modules and can lead to eventual failure. This paper focuses on two particular issues. Firstly the performance of the gap between the substrate metallisation on which the collector and emitter of the device sit is examined. Secondly, the performance of the substrate-gel interface is examined once samples have been thermally aged in a humid environment.
Keywords :
metallisation; modules; partial discharges; power electronics; thermal analysis; dielectric system; high electric field; high module power densities; partial discharge; power electronic module; substrate metallisation; substrate-gel interface; thermal cycling; Dielectric substrates; Metallization; Multichip modules; Partial discharges; Power electronics; Power engineering and energy; Power system reliability; Reliability engineering; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Motion Control Conference, 2009. IPEMC '09. IEEE 6th International
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-3556-2
Electronic_ISBN :
978-1-4244-3557-9
Type :
conf
DOI :
10.1109/IPEMC.2009.5157573
Filename :
5157573
Link To Document :
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