DocumentCode :
2422227
Title :
A Raman spectroscopic study of bulk and surface ageing phenomena in polyethylene
Author :
Liu, X.S. ; Vaughan, A.S. ; Chen, G.
Author_Institution :
Xi´´an Jiaotong Univ., China
fYear :
2003
fDate :
19-22 Oct. 2003
Firstpage :
145
Lastpage :
148
Abstract :
Low density polyethylene (LDPE) films were subjected to a range of electrical stresses. Analysis of samples aged in the bulk by Raman microprobe spectroscopy indicated that changes in the spectra are only observed when samples are subjected to high electrical stresses for long periods of time. Even then, no specific chemical effects were detected; degradation only manifested itself in the form of mild fluorescence. Corona-induced surface reactions were also examined. Although the surface texture was found to change radically, subsequent Raman analysis revealed few chemical changes in the polymer, implying that erosion involves fragmentation of the LDPE and the formation of volatile by-products. No residues were detected on the samples. In addition to the LDPE itself, the corona electrode was also analyzed. This revealed the presence of extensive deposits with the fingerprint of sp2 hybridized carbon. The significance of these results are discussed with respect to high field ageing processes, particularly, the development of electrical trees.
Keywords :
Raman spectra; ageing; corona; fluorescence; polyethylene insulation; polymer films; surface chemistry; surface texture; trees (electrical); LDPE; Raman microprobe spectroscopy; Raman spectroscopic study; bulk ageing phenomena; corona-induced surface reactions; electrical stresses; electrical trees; fluorescence; fragmentation; low density polyethylene; polyethylene; polyethylene films; sp2 hybridized carbon; surface ageing phenomena; surface texture; volatile by-products; Aging; Chemical analysis; Degradation; Fluorescence; Plastic films; Polyethylene; Raman scattering; Spectroscopy; Stress; Surface texture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2003. Annual Report. Conference on
Print_ISBN :
0-7803-7910-1
Type :
conf
DOI :
10.1109/CEIDP.2003.1254815
Filename :
1254815
Link To Document :
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