Title : 
The effect of stress induced anistotropy on magnetoresistive heads with soft adjacent layer
         
        
            Author : 
Po-Kang Wang ; Ewasko, R. ; Anderson, R.
         
        
            Author_Institution : 
IBM Alamenden Research Center
         
        
        
        
        
        
            Keywords : 
Anisotropic magnetoresistance; Compressive stress; Degradation; Fabrication; Magnetic heads; Magnetic sensors; Magnetostriction; Nonlinear distortion; Thick film sensors; Transfer functions;
         
        
        
        
            Conference_Titel : 
Magnetics Conference, 1992. Digests of Intermag '92., International
         
        
            Conference_Location : 
St. Louis, MO, USA
         
        
            Print_ISBN : 
0-7803-0637-6
         
        
        
            DOI : 
10.1109/INTMAG.1992.696268