DocumentCode :
2422270
Title :
The effect of stress induced anistotropy on magnetoresistive heads with soft adjacent layer
Author :
Po-Kang Wang ; Ewasko, R. ; Anderson, R.
Author_Institution :
IBM Alamenden Research Center
fYear :
1992
fDate :
13-16 April 1992
Firstpage :
85
Lastpage :
85
Keywords :
Anisotropic magnetoresistance; Compressive stress; Degradation; Fabrication; Magnetic heads; Magnetic sensors; Magnetostriction; Nonlinear distortion; Thick film sensors; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
Type :
conf
DOI :
10.1109/INTMAG.1992.696268
Filename :
696268
Link To Document :
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