Title :
The effect of stress induced anistotropy on magnetoresistive heads with soft adjacent layer
Author :
Po-Kang Wang ; Ewasko, R. ; Anderson, R.
Author_Institution :
IBM Alamenden Research Center
Keywords :
Anisotropic magnetoresistance; Compressive stress; Degradation; Fabrication; Magnetic heads; Magnetic sensors; Magnetostriction; Nonlinear distortion; Thick film sensors; Transfer functions;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696268