DocumentCode
2422354
Title
Static analysis test platform construction for embedded systems
Author
Wang, Hongcheng ; Ding, Zhigang ; Zhong, Yuwei
Author_Institution
Shanghai Dev. Center, Comput. Software Technol., Shanghai
fYear
2008
fDate
7-9 July 2008
Firstpage
808
Lastpage
812
Abstract
Greatly progress has been made in embedded system product recent years. With widely application of embedded system, measures must be taken to assure its quality and accelerate its development time. A static analysis test platform for embedded systems is constructed in this paper with two static analysis tools, PolySpace and Pclint. Since embedded software and ordinary software are not the same, these tools can be useful after complicated configuration. By comparing the differences between embedded software and ordinary software, a set of steps are introduced, which are concluded and verified by authorspsila practice in recent two years. In order to present organized configuration processes, analysis result of 5 source files are shown to illustrate the effect of this platform. This analysis test platform should be used as early as possible during embedded system development cycle.
Keywords
embedded systems; program diagnostics; program testing; software quality; Pclint; PolySpace; embedded systems; source file analysis; static analysis; Application software; Automatic testing; Computer bugs; Embedded software; Embedded system; Programming; Runtime; Software testing; System testing; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Audio, Language and Image Processing, 2008. ICALIP 2008. International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-1723-0
Electronic_ISBN
978-1-4244-1724-7
Type
conf
DOI
10.1109/ICALIP.2008.4589980
Filename
4589980
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