Title :
Static analysis test platform construction for embedded systems
Author :
Wang, Hongcheng ; Ding, Zhigang ; Zhong, Yuwei
Author_Institution :
Shanghai Dev. Center, Comput. Software Technol., Shanghai
Abstract :
Greatly progress has been made in embedded system product recent years. With widely application of embedded system, measures must be taken to assure its quality and accelerate its development time. A static analysis test platform for embedded systems is constructed in this paper with two static analysis tools, PolySpace and Pclint. Since embedded software and ordinary software are not the same, these tools can be useful after complicated configuration. By comparing the differences between embedded software and ordinary software, a set of steps are introduced, which are concluded and verified by authorspsila practice in recent two years. In order to present organized configuration processes, analysis result of 5 source files are shown to illustrate the effect of this platform. This analysis test platform should be used as early as possible during embedded system development cycle.
Keywords :
embedded systems; program diagnostics; program testing; software quality; Pclint; PolySpace; embedded systems; source file analysis; static analysis; Application software; Automatic testing; Computer bugs; Embedded software; Embedded system; Programming; Runtime; Software testing; System testing; Time measurement;
Conference_Titel :
Audio, Language and Image Processing, 2008. ICALIP 2008. International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-1723-0
Electronic_ISBN :
978-1-4244-1724-7
DOI :
10.1109/ICALIP.2008.4589980