Title :
A foreground digital calibration by switching control scheme for A 12-bit SAR ADC
Author :
Huabin Chen ; Jixuan Xiang ; Chixiao Chen ; Fan Ye ; Jun Xu ; Junyan Ren
Author_Institution :
State-key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
Abstract :
This paper proposed a digital method to calibrate nonlinearity caused by capacitor mismatch and parasitic capacitors in the split-capacitor DAC for a 12-bit 50 MS/s SAR ADC. By applying foreground switching control scheme and without additional analog circuits, a group of calibration indexes are measured and added to the output codes to compensate the conversion error. Simulation results obtained from a 65nm CMOS LP process prototype ADC shows that SFDR at 20.6 MHz input and 1.2 V supply can be improved from 66.52 dB to 76.13 dB. DNL/INL are measured as +0.68~-1 LSB/+3.59~-3.61 LSB and corrected to +1.62~-0.1 LSB /+1.73~-1.61 LSB respectively.
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; CMOS LP process; SAR ADC; analog-digital conversion; capacitor mismatch; foreground digital calibration; nonlinearity calibration; parasitic capacitor; size 65 nm; split-capacitor DAC; successive approximate register; switching control; voltage 1.2 V; Abstracts; Frequency conversion; Signal to noise ratio; Switches;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4799-3296-2
DOI :
10.1109/ICSICT.2014.7021568