DocumentCode :
2423289
Title :
Calculation of current density along insulator surface using field and circuit theory approaches
Author :
El-Hag, A.H. ; Jayaram, S.H. ; Cherney, E.A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
fYear :
2003
fDate :
19-22 Oct. 2003
Firstpage :
375
Lastpage :
378
Abstract :
The paper presents two different methods to compute the current density along contaminated and wet silicone rubber insulator surface. The first method, based on field theory approach, uses the commercial software FEMLAB® to compute the current density. The conductivity of the contamination layer used in the calculations was extracted from the measured equivalent salt deposit density (ESDD) separately for different regions of the insulator surfaces. The second method is based on the circuit theory approach, and, the insulator surface was divided into different sections for resistance calculations to account for different contamination levels. Rankings based on the calculated current densities based on segmentation of the insulator surface for ESDD measurements match with those extracted from measured leakage currents.
Keywords :
current density; leakage currents; silicone rubber; surface contamination; surface resistance; circuit theory; contamination layer; current density; equivalent salt deposit density; field theory; insulator surface; leakage currents; wet silicone rubber insulator surface; Circuit theory; Current density; Current measurement; Density measurement; Electrical resistance measurement; Insulation; Pollution measurement; Rubber; Surface contamination; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2003. Annual Report. Conference on
Print_ISBN :
0-7803-7910-1
Type :
conf
DOI :
10.1109/CEIDP.2003.1254871
Filename :
1254871
Link To Document :
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