Title :
The analysis on effect of digital process on the performance of PWM inverter
Author :
Shan, Hongtao ; Chen, Xikun ; Kong, Xuejuan ; Zhang, Yu ; Liu, Zhao ; Li, Hongbo ; Li, Taofeng
Author_Institution :
Coll. of Electr. & Inf. Eng., Huibei automobile Ind. Inst., Shiyan, China
Abstract :
Compared with analog control, digital control adopted in PWM inverter possesses the evident advantages but the traditional PID control strategy which is realized in digital method often can´t achieve better performance than in analog control. In past references, there is hardly quantitative analysis on the effect of digital process on the performance of PWM inverter. This paper did a creative research about the zero-order-hold process and one-step-delay control effect on the performance of PWM inverter. The process of zero-order-hold and one-step-delay control were analyzed why the digital process influences PWM inverter´s performance in this paper. The process of zero-order-hold and one-step-delay control varies the system´s stability with sample time. Zero-order-hold reduces the stable scope to a large extent compared with analog control, and limits the performance improvement of digital control system. One-step-delay with different sample time brings different influence on the system stability. Finally relevant experiments in a single phase inverter verify the theoretical analysis on the effect of digital process on the performance of PWM inverter.
Keywords :
PWM invertors; delays; digital control; stability; three-term control; PID control strategy; PWM inverter; analog control; digital control system; digital process effect; one-step-delay control effect; quantitative analysis; system stability; zero-order-hold process; Automotive engineering; Bridge circuits; Control systems; Digital control; Educational institutions; Industrial control; Performance analysis; Power engineering and energy; Pulse width modulation inverters; Three-term control;
Conference_Titel :
Power Electronics and Motion Control Conference, 2009. IPEMC '09. IEEE 6th International
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-3556-2
Electronic_ISBN :
978-1-4244-3557-9
DOI :
10.1109/IPEMC.2009.5157636