Title :
SEE in-flight data for two static 32KB memories on high earth orbit
Author :
Duzellier, S. ; Bourdarie, S. ; Velazco, R. ; Nicolescu, B. ; Ecoffet, R.
Author_Institution :
ONERA/DESP, Toulouse, France
Abstract :
SEE (single event effect) in-flight measurements are presented for two 32 kB SRAMs in the MPTB orbit. The major contribution to the event rates comes from the proton radiation belts. During solar events, stuck bits occurred and the SEU rate is correlated to the high energy proton flux but the amplitude is not conserved.
Keywords :
SRAM chips; aerospace testing; integrated circuit reliability; integrated circuit testing; radiation belts; radiation hardening (electronics); space vehicle electronics; 32 kB; MPTB high earth orbit; SEE in-flight data; SEE in-flight measurements; SEU rate; SRAM; energy proton flux; event rates; proton radiation belts; radiation testing; single event effects; single event upsets; solar events; static memories; stuck bits; Artificial neural networks; Belts; Circuit testing; Cyclic redundancy check; Earth; Extraterrestrial measurements; Protons; Satellites; Telemetry; Uncertainty;
Conference_Titel :
Radiation Effects Data Workshop, 2002 IEEE
Print_ISBN :
0-7803-7544-0
DOI :
10.1109/REDW.2002.1045524
