A novel read tracking circuit design based on compensation circuit

In common SRAM read tracking circuit, process and temperature fluctuations may cause SRAM read failure. Thus, a novel read tracking circuit is proposed using corner compensation technology and temperature compensation technology in this paper. The proposed tracking circuit compensates the dummy bit line for different current when working in different process corners and temperature, which dramatically reduces the impact of process corner and temperature. The proposed circuit is simulated based on the 28 nm CMOS process and the result proved that the proposed circuit is valid and reliable.