Title :
Single event testing of DC/DC converters for space flight
Author :
Warren, Kevin ; Roth, David ; Kinnison, Jim ; Pappalardo, Richard
Author_Institution :
Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA
Abstract :
Hybrid DC/DC converters from two major manufacturers were tested for single event transient and catastrophic single event induced failures. The converters were evaluated under a range of loading conditions and input voltages.
Keywords :
DC-DC power convertors; circuit reliability; circuit testing; failure analysis; radiation hardening (electronics); space vehicle electronics; transient analysis; SET; catastrophic single event induced failures; converter loading conditions/input voltages; hybrid DC/DC converters; single event testing; single event transients; space flight electronics; space vehicle DC/DC converters; DC-DC power converters; FETs; Inspection; Laboratories; Manufacturing; Microscopy; Monitoring; Resistors; Testing; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2002 IEEE
Print_ISBN :
0-7803-7544-0
DOI :
10.1109/REDW.2002.1045538
