Abstract :
Describes the Interactive NEtwork Simulation tool (INES), which supports the simulation of multilayer pattern processing. Since the sequence, the interconnections, and the functional characteristics of the layers depend on the ideas and the needs of the user, INES does not assume a special interconnection scheme but makes it possible to set up visually an interconnection scheme of predefined units. The possible interconnections obey some restrictions (rules), representing a kind of visual programming language. Thus, the programming and simulation language system can be used for the design and evaluation of a pattern-processing neural network computer. Since the graphical editor, the network interpreter, and the modules of the base units are independently defined the user can program his own base units (and even his own interpreter) in the programming language of his choice. By decomposition into separate units, the classical, historically grown (Fortran-based) simulation program becomes a collection of reusable, clearly structured software units. Standard problems like I/O filter functions and monitors have to be implemented only once, so that the software productivity is increased
Keywords :
computerised pattern recognition; computerised picture processing; digital simulation; interactive programming; interactive systems; neural nets; simulation languages; INES; base units; filter functions; graphical editor; input/output problems; interactive network simulation tool; interconnection scheme; monitors; multilayer pattern processing; network interpreter; neural network computer; predefined units; restrictions; reusable software units; simulation language; software productivity; visual programming language; Computational modeling; Computer languages; Computer networks; Computer simulation; Filters; LAN interconnection; Multi-layer neural network; Neural networks; Software reusability; Software standards;
Conference_Titel :
Tools for Artificial Intelligence, 1989. Architectures, Languages and Algorithms, IEEE International Workshop on