Title :
Nuclear dose rate, total dose and neutron radiation testing of COTS devices
Author :
Mulford, Stewart G. ; Brown, Douglas N. ; McMaster, Angela L.
Author_Institution :
Raytheon Co., Sudbury, MA, USA
Abstract :
A compendium of radiation data for commercial off-the-shelf (COTS) devices is presented for the narrow pulse gamma dose rate, total dose gamma and neutron environments. The devices range from power MOSFETs to microprocessors and controllers. Most of the testing was performed to determine functional survivability.
Keywords :
gamma-ray effects; integrated circuit reliability; integrated circuit testing; integrated memory circuits; microcontrollers; microprocessor chips; neutron effects; power MOSFET; semiconductor device reliability; semiconductor device testing; COTS devices; commercial off-the-shelf devices; controllers; functional survivability; microcontroller; microprocessors; narrow pulse gamma dose rate environment; neutron environment; neutron radiation testing; nuclear dose rate testing; power MOSFET; radiation data; total dose gamma environment; total dose testing; Dosimetry; Error correction codes; MOSFETs; Microprocessors; Neutrons; Performance evaluation; Radiation hardening; Read-write memory; Temperature; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2002 IEEE
Print_ISBN :
0-7803-7544-0
DOI :
10.1109/REDW.2002.1045545
