Inverse scattering problem of homogeneous dielectrics using Genetic Algorithms

Author

Garcia-Gonzalez, Cebrian ; Alvarez-Lopez, Yuri ; Las-Heras, Fernando ; Laviada, Jaime ; Arboleya-Arboleya, Ana ; Rocca, Paolo ; Oliveri, G. ; Massa, A.

Author_Institution

Dept. Ing. Electr., Area de Teor. de la Senal y Comun., Univ. de Oviedo, Gijon, Spain

fYear

2014

fDate

6-11 April 2014

Firstpage

2788

Lastpage

2791

Abstract

An inverse scattering method based on the Surface Equivalent Principle and the use of Genetic Algorithms is presented in this contribution. This technique is used for the estimation of constitutive parameter of homogenous dielectrics with any permittivity and conductivity. The dielectric under test is illuminated with a set of plane waves at a single frequency, under 2D TM case assumption. The dielectric composition is estimated from the scattered field measured on a circumferential observation domain. Proper Genetic Algorithm tuning as well as inverse problem parameters coding have been tested by means of simulation examples.

Keywords

electromagnetic wave scattering; genetic algorithms; permittivity; 2D TM; dielectric under test; genetic algorithms; homogeneous dielectrics; inverse scattering method; plane waves; surface equivalent principle; Decision support systems; Europe; Microwave antennas; Microwave theory and techniques; Remote sensing; dielectrics; imaging; inverse scattering problem;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation (EuCAP), 2014 8th European Conference on

Conference_Location

The Hague

Type

conf

DOI

10.1109/EuCAP.2014.6902404

Filename

6902404