Title :
Comparative analysis of low dose-rate, accelerated, and standard cobalt-60 radiation response data for a low-dropout voltage regulator and a voltage reference
Author :
Abare, Wayne ; Brueggeman, Frank ; Pease, Ron ; Krieg, Jeff ; Simons, Mayrant
Author_Institution :
Harris Corp., Melbourne, FL, USA
Abstract :
This paper presents the results of cobalt-60 response measurements made on a low dropout voltage regulator and a shunt reference for three different radiation test conditions: low dose rate, accelerated (elevated temperature irradiation) and standard (50-300 rad(SiO2)/s). The accelerated test is shown to correlate well with the low dose rate failure of the reference but not for the failure of the regulator.
Keywords :
failure analysis; integrated circuit reliability; integrated circuit testing; life testing; radiation hardening (electronics); reference circuits; space vehicle electronics; voltage regulators; 50 to 300 rad; accelerated testing; analog circuits; bipolar integrated circuits; cobalt-60 radiation tests; cobalt-60 response measurements; elevated temperature irradiation; failure analysis; ionization; low dose-rate tests; low-dropout voltage regulators; radiation effects; radiation test conditions; reference circuit low dose rate failure; shunt references; space applications; voltage reference IC; Acceleration; Circuit testing; Cranes; Ionizing radiation; Life estimation; Low voltage; Measurement standards; Regulators; Space technology; Temperature;
Conference_Titel :
Radiation Effects Data Workshop, 2002 IEEE
Print_ISBN :
0-7803-7544-0
DOI :
10.1109/REDW.2002.1045550
