DocumentCode :
2424188
Title :
Endurance behavior of the SF6/N2 mixtures experiment under AC and impulse voltages
Author :
Zheng, D.C. ; Chen, C.T. ; Liu, H.W. ; Yang, J.X.
Author_Institution :
Harbin Univ. of Sci. & Technol., China
fYear :
2003
fDate :
19-22 Oct. 2003
Firstpage :
581
Lastpage :
584
Abstract :
The aims are to develop new kinds of insulating mediums being technically as well as economically attractive and fully understand the electronegative gas characteristic of endurance voltages, mechanism of partial discharge and widen their using areas in the high voltage system experiments. The article presents the experiment procedures, contents are involved in as follow: point-plane, point-point, co-axial cylindrical and co-centric sphere electrode systems, and industrial purity SF6 and its mixture combining N2 are filled into the experiment chamber in different partial pressure and applied the AC and impulse voltages in different pressures. The mechanism of initiated PD potentials and breakdown of the SF6 and SF6/N2 have been analyzed theoretically according to the molecular structure and physical characteristics of the electro-negative vases, the research works are helpful to develop and widen using fields of the SF6 and its mixtures in high voltage engineering.
Keywords :
SF6 insulation; electric breakdown; electrodes; high-voltage techniques; nitrogen; partial discharges; AC voltages; SF6-N2; SF6/N2 mixtures; breakdown; co-axial electrode systems; co-centric sphere electrode systems; cylindrical electrode systems; electronegative gas characteristic; endurance behavior; high voltage system; impulse voltages; partial discharge; partial pressure; point-plane; point-point; Breakdown voltage; Dielectrics and electrical insulation; Electrodes; Environmental economics; Gas insulation; Laboratories; Partial discharges; Power generation economics; Power system economics; Sulfur hexafluoride;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2003. Annual Report. Conference on
Print_ISBN :
0-7803-7910-1
Type :
conf
DOI :
10.1109/CEIDP.2003.1254921
Filename :
1254921
Link To Document :
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