DocumentCode

2424248

Title

Measurements of thin film disk wear

Author

Phipps, P.B.P.

Author_Institution

IBM Research Lab

fYear

1990

fDate

17-20 April 1990

Keywords

Q measurement; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 1990. Digests of INTERMAG '90. International

Conference_Location

Brighton, UK

Type

conf

DOI

10.1109/INTMAG.1990.734805

Filename

734805