DocumentCode :
2424248
Title :
Measurements of thin film disk wear
Author :
Phipps, P.B.P.
Author_Institution :
IBM Research Lab
fYear :
1990
fDate :
17-20 April 1990
Keywords :
Q measurement; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1990. Digests of INTERMAG '90. International
Conference_Location :
Brighton, UK
Type :
conf
DOI :
10.1109/INTMAG.1990.734805
Filename :
734805
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2424248
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