DocumentCode
2424256
Title
Line-by-line method of calculating emission coefficients of thermal plasmas consisting of monatomic species
Author
Menart, J. ; Pfender, E. ; Heberlein, J.
Author_Institution
Dept. of Mech. Eng., Minnesota Univ., Minneapolis, MN, USA
fYear
1995
fDate
5-8 June 1995
Firstpage
276
Abstract
Summary form only given, as follows. To accurately model a plasma´s thermal characteristics reliable radiation property data is required. We have written a program which calculates these properties. This program utilizes a theoretically rigorous method for obtaining radiation property data of thermal plasmas composed of monatomic, nonhydrogenic species. A computationally expensive, line-by-line technique is utilized. Natural, van der Waals, resonance and quadratic Stark broadening mechanisms are included in determining the line half-widths. In addition to line radiation, free-bound continuum and free-free continuum for both ions and neutral particles are considered. The fundamental specific radiation property determined by the program is the optically thin emission coefficient as a function of the wavelength. From this property the wavelength dependent, optically thin absorption coefficient is easily determined. Properties that are more suitable for engineering analysis, such as the wavelength integrated, optically thin emission coefficient and the net emission coefficient are also calculated. An overview of the method of calculating the radiation properties is given. Comparisons are made to published wavelength integrated, optically thin emission coefficients for argon plasmas obtained from experimental measurements and to some published net emission coefficients for argon/copper plasmas calculated with an analytical technique different than that used here. In addition to the comparison data some additional results on the effect of copper impurities in argon are presented.
Keywords
Stark effect; argon; copper; plasma; plasma diagnostics; plasma impurities; plasma properties; plasma theory; Ar; Ar-Cu; Stark broadening mechanisms; emission coefficients; engineering analysis; free-bound continuum; free-free continuum; line half-widths; line radiation; line-by-line technique; monatomic nonhydrogenic species; monatomic species; net emission coefficient; optically thin absorption coefficient; optically thin emission coefficien; overview; radiation property; radiation property data; thermal characteristics; thermal plasmas; van der Waals broadening mechanisms; Absorption; Argon; Copper; Integrated optics; Particle beam optics; Plasma measurements; Plasma properties; Plasma waves; Resonance; Stimulated emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
Conference_Location
Madison, WI, USA
ISSN
0730-9244
Print_ISBN
0-7803-2669-5
Type
conf
DOI
10.1109/PLASMA.1995.533513
Filename
533513
Link To Document