DocumentCode :
242451
Title :
High negative bias stability Gadolinium-doped Aluminum-Zinc-Oxide thin film transistors
Author :
Junchen Dong ; Dedong Han ; Feilong Zhao ; Nannan Zhao ; Jing Wu ; Zhuofa Chen ; Yingying Cong ; Shengdong Zhang ; Xing Zhang ; Lifeng Liu ; Yi Wang
Author_Institution :
Shenzhen Grad. Sch., Peking Univ., Shenzhen, China
fYear :
2014
fDate :
28-31 Oct. 2014
Firstpage :
1
Lastpage :
3
Abstract :
Thin film transistors (TFTs) with Gadolinium-doped Aluminum-Zinc-Oxide (Gd-AZO) thin film as the active layer were fabricated on glass substrate at room temperature. Amorphous Gd-AZO crystal structure which is benefit for high performance devices was obtained. The variation trend of TFTs properties with O2 partial pressure was investigated. Excellent negative bias stress stability and transmittance Gd-AZO TFTs was realized, too. The ultimate TFT has excellent properties such as a saturation mobility of 238 cm2/V·s, an on-to-off current ratio of 6.08×108, a threshold of 1.92V, and a sub-threshold swing of 161 mV/decade.
Keywords :
aluminium compounds; crystal structure; gadolinium; negative bias temperature instability; semiconductor device reliability; thin film transistors; AlZnO; Gd; amorphous Gd-AZO crystal structure; gadolinium-doped aluminum-zinc-oxide TFT; glass substrate; high negative bias stability; negative bias stress stability; oxide partial pressure; room temperature; temperature 293 K to 298 K; thin film transistors; voltage 1.92 V; Abstracts; Indium tin oxide; Logic gates; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4799-3296-2
Type :
conf
DOI :
10.1109/ICSICT.2014.7021650
Filename :
7021650
Link To Document :
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