• DocumentCode
    2424583
  • Title

    Author index

  • fYear
    2010
  • fDate
    19-22 April 2010
  • Firstpage
    356
  • Lastpage
    357
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2010 28th
  • Conference_Location
    Santa Cruz, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4244-6649-8
  • Type

    conf

  • DOI
    10.1109/VTS.2010.5469529
  • Filename
    5469529
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2424583