DocumentCode :
2424583
Title :
Author index
fYear :
2010
fDate :
19-22 April 2010
Firstpage :
356
Lastpage :
357
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2010 28th
Conference_Location :
Santa Cruz, CA
ISSN :
1093-0167
Print_ISBN :
978-1-4244-6649-8
Type :
conf
DOI :
10.1109/VTS.2010.5469529
Filename :
5469529
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2424583
