Title :
W-band InGaAs HEMT low noise amplifiers
Author :
Duh, K.H.G. ; Chao, P.C. ; Ho, P. ; Tessmer, A. ; Liu, S.M.J. ; Kao, M.Y. ; Smith, P.M. ; Ballingall, J.M.
Author_Institution :
GE Electron. Lab., Syracuse, NY, USA
Abstract :
The authors report 0.15- mu m gate length GaAs-based and InP-based InGaAs channel high-electron-mobility transistors (HEMTs) that have exhibited state-of-the-art noise and gain performance well up to 100 GHz. 94-GHz noise figures of 2.4 and 1.4 dB with gains of 5.4 and 6.5 dB have been measured from GaAs- and InP-based HEMTs, respectively. High-performance W-band multistage amplifiers have been built using these devices. A two-stage GaAs-based amplifier exhibits a noise figure of 4.2 dB with a gain of 9.7 dB at 93 GHz, and a three-stage amplifier yields a 4.5-dB noise figure with 14.8-dB gain at 94 GHz. The best two-stage amplifier built with InP-based HEMTs exhibits a minimum noise figure of 3.2 dB with a gain of 11.5+or-0.4 dB from 88 to 96 GHz. A noise figure as low as 3.3 dB with gain of 17.3+or-0.5 dB from 88 to 96 GHz has also been demonstrated from a three-stage amplifier. The characteristics and performance of both devices are presented.<>
Keywords :
III-V semiconductors; gallium arsenide; high electron mobility transistors; indium compounds; microwave amplifiers; solid-state microwave circuits; 0.15 micron; 1.4 to 4.5 dB; 5.4 to 17.8 dB; 88 to 96 GHz; GaAs-InGaAs; HEMT; III-V semiconductors; InGaAs; InP-InGaAs; W-band multistage amplifiers; gain performance; high-electron-mobility transistors; low noise amplifiers; noise figures; three-stage amplifier; two-stage amplifier; Gain measurement; Gallium arsenide; HEMTs; Indium gallium arsenide; Indium phosphide; Laboratories; Low-noise amplifiers; Noise figure; Noise measurement; Performance gain;
Conference_Titel :
Microwave Symposium Digest, 1990., IEEE MTT-S International
Conference_Location :
Dallas, TX
DOI :
10.1109/MWSYM.1990.99650