• DocumentCode
    2424690
  • Title

    Special session 12A: Panel adaptive analog test: Feasibility and opportunities ahead

  • Author

    Stratigopoulos, Haralampos-G.

  • Author_Institution
    TIMA-CNRS
  • fYear
    2010
  • fDate
    19-22 April 2010
  • Firstpage
    353
  • Lastpage
    353
  • Abstract
    The production test of analog circuits involves a variety of specification tests. The procedure guarantees outgoing quality levels at the expense of a high cost since it demands long test times and sophisticated test instrumentation. The cost of test is ever increasing as a factor in the overall cost of manufacturing ICs and, as such, it is an area for industry focus, innovation and improvement.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2010 28th
  • Conference_Location
    Santa Cruz, CA, USA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4244-6649-8
  • Type

    conf

  • DOI
    10.1109/VTS.2010.5469533
  • Filename
    5469533
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2424690