DocumentCode :
2424690
Title :
Special session 12A: Panel adaptive analog test: Feasibility and opportunities ahead
Author :
Stratigopoulos, Haralampos-G.
Author_Institution :
TIMA-CNRS
fYear :
2010
fDate :
19-22 April 2010
Firstpage :
353
Lastpage :
353
Abstract :
The production test of analog circuits involves a variety of specification tests. The procedure guarantees outgoing quality levels at the expense of a high cost since it demands long test times and sophisticated test instrumentation. The cost of test is ever increasing as a factor in the overall cost of manufacturing ICs and, as such, it is an area for industry focus, innovation and improvement.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2010 28th
Conference_Location :
Santa Cruz, CA, USA
ISSN :
1093-0167
Print_ISBN :
978-1-4244-6649-8
Type :
conf
DOI :
10.1109/VTS.2010.5469533
Filename :
5469533
Link To Document :
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