DocumentCode
2424795
Title
Session 11: Session 11A: RF test
fYear
2010
fDate
19-22 April 2010
Firstpage
329
Lastpage
329
Abstract
Start of the above-titled section of the conference proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2010 28th
Conference_Location
Santa Cruz, CA
ISSN
1093-0167
Print_ISBN
978-1-4244-6649-8
Type
conf
DOI
10.1109/VTS.2010.5469538
Filename
5469538
Link To Document