Title :
Experience of Designing and Application of CAD Systems in Microelectronics. Proceedings of the 7th International Conference. CADSM 2003 (IEEE Cat. No.03EX618)
Abstract :
The following topics are dealt with: technological design problems; models and methods for radioelectronics device and system design; design of specialized systems and devices; technical design; electromagnetic and thermal problems in microelectronics; behavioral modeling of semiconductor devices, circuits and systems; management, testing and reliability problems; CAD modern information technology; applied linguistics in modern information society; research and training system on chip design.
Keywords :
circuit CAD; integrated circuit design; integrated circuit reliability; integrated circuit testing; monolithic integrated circuits; system-on-chip; CAD; applied linguistics; behavioral modeling; electromagnetic problems; information technology; management; microelectronics; radioelectronics device design; reliability; semiconductor devices; system design; system on chip design; technical design; testing; thermal problems; Design automation; Integrated circuit design; Integrated circuit reliability; Integrated circuit testing; Monolithic integrated circuits;
Conference_Titel :
CAD Systems in Microelectronics, 2003. CADSM 2003. Proceedings of the 7th International Conference. The Experience of Designing and Application of
Conference_Location :
Slavske, Ukraine
Print_ISBN :
966-553-278-2
DOI :
10.1109/CADSM.2003.1254973
