• DocumentCode
    2425092
  • Title

    Special session 9B: New topic test facilities and infrastructure in Canada

  • Author

    Kaminska, Bozena ; McWalter, Ian L

  • Author_Institution
    SFU, BC, Canada
  • fYear
    2010
  • fDate
    19-22 April 2010
  • Firstpage
    281
  • Lastpage
    281
  • Abstract
    Over the last five years extensive test infrastructure has been deployed at Canadian Universities, funded by the Canada Foundation for Innovation (CFI) and managed jointly by CMC Microsystems, located at Kingston, Ontario and Principal Investigators at each of four sites. These test facilities are a part of the National Design Network (NDN) in Canada which has been developed over the last 25 years to serve researchers in the design, fabrication and test of microsystems prototypes. This presentation will outline the capabilities of the laboratories and the accessibility of the equipment through local and remote access. The four specialized laboratories enable the testing of Radio Frequency, Photonics, Mixed-Signal and High Speed Digital systems. About 200 researchers at 23 Canadian Universities participate in this `Testing Collaboratory´ and they are connected using a wide area, fiber optic network provide by CANARIE. Hands-on assistance, training and specialist consultation is required for the operation of such sophisticated equipment and this is provided by CMC personnel on-site at each location. Activities include assistance in equipment configuration, sample or DUT management, provision of documentation, configuring of the communications links, development of tools for automation of test and data collection, and protection of Intellectual Property. Finally, a selection of the research that has been enabled by the wide availability of this infrastructure will be presented, including work on optical telecommunications systems, security threats to cryptographic systems, new signal processing techniques and RF MEMS devices.
  • Keywords
    cryptography; industrial property; CANARIE; CMC microsystems; Canada Foundation for Innovation; Canadian Universities; DUT management; Kingston; National Design Network; Ontario; RF MEMS devices; communications links; cryptographic systems; intellectual property; microsystems prototypes; mixed-signal and high speed digital systems; optical telecommunications systems; photonics; radio frequency testing; security threats; signal processing techniques;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2010 28th
  • Conference_Location
    Santa Cruz, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4244-6649-8
  • Type

    conf

  • DOI
    10.1109/VTS.2010.5469554
  • Filename
    5469554