The generalized analysis of relaxation processes in electromagnetic and mechanical oscillatory models fundamental for mathematical modeling of microelectronic components of integrated systems

Author

Lobur, M.

Author_Institution

CAD/CAM Dept., Lviv Polytech. Nat. Univ., Ukraine

fYear

2003

fDate

18-22 Feb. 2003

Firstpage

74

Lastpage

76

Abstract

From a position of isomorphism of the compelled mechanical and electromagnetic fluctuation relaxation processes in dynamic oscillatory conditions as base models for mathematically designing microelectronic components of built-in systems are generalized. The divided analysis for active and dissipative component of an energy exchange between cooperating components of oscillatory systems in the resonant area is carried out.

Keywords

fluctuations; integrated circuit modelling; isomorphism; oscillations; relaxation oscillators; resonance; IC microelectronic component modeling; active energy exchange; built-in systems; cooperating components energy exchange; dissipative energy exchange; dynamic oscillatory conditions; electromagnetic oscillatory models; energy relaxation; fluctuations; isomorphism; mechanical oscillatory models; relaxation processes analysis; resonant oscillatory system; Electromagnetic analysis; Electromagnetic modeling; Fluctuations; Frequency; Impedance; Mathematical model; Microelectronics; Oscillators; RLC circuits; Signal analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

CAD Systems in Microelectronics, 2003. CADSM 2003. Proceedings of the 7th International Conference. The Experience of Designing and Application of

Print_ISBN

966-553-278-2

Type

conf

DOI

10.1109/CADSM.2003.1254987

Filename

1254987