DocumentCode :
2425244
Title :
Simulation based approach to modeling product and process interactions
Author :
Palaniswamy, S. ; Singh, Navab
Author_Institution :
Dept. of Ind. & Manuf. Eng., Wayne State Univ., Detroit, MI, USA
fYear :
1997
fDate :
27-31 Jul 1997
Firstpage :
956
Abstract :
Summary form only as given. The major corporate goals of any enterprise are to make more profit, increase its market share and provide workforce stability among others. To achieve these goals in a global, highly dynamic and very competitive environment, it is absolutely necessary that a company keeps on enlarging its technological, systems and methodology envelope to minimize unit cost, reduce lead time and improve quality of products right at the product development stage. To accomplish these tasks, some innovative technologies, methodologies and systems have to be developed and integrated. For these things to happen, it is necessary that one understands the underlying phenomenon of product development. In this paper, the authors´ objectives are to capture the product process interactions. They study the impact of various product design and process alternatives on cost, quality and lead time. For this purpose, they develop a simulation model which is coded in SIMAN. They illustrate the concepts using a case study of a journal bearing system.
Keywords :
management of change; product development; research and development management; R&D management; SIMAN; change management; competitive environment; computer simulation model; corporate goals; enterprises; innovative technologies; lead time; product development stage; product quality; product/process interactions modelling; unit cost; Costs; Lead time reduction; Manufacturing industries; Manufacturing processes; Product design; Product development; Stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Innovation in Technology Management - The Key to Global Leadership. PICMET '97: Portland International Conference on Management and Technology
Print_ISBN :
0-7803-3574-0
Type :
conf
DOI :
10.1109/PICMET.1997.653736
Filename :
653736
Link To Document :
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