• DocumentCode
    2425262
  • Title

    A new multi-modal similarity measure for fast gradient-based 2D-3D image registration

  • Author

    Pickering, Mark R. ; Muhit, Abdullah A. ; Scarvell, Jennie M. ; Smith, Paul N.

  • Author_Institution
    Sch. of Inf. Technol. & Electr. Eng., Univ. of New South Wales, Canberra, ACT, Australia
  • fYear
    2009
  • fDate
    3-6 Sept. 2009
  • Firstpage
    5821
  • Lastpage
    5824
  • Abstract
    2D-3D image registration has been adopted in many clinical applications such as image-guided surgery and the kinematic analysis of bones in knee and ankle joints. In this paper we propose a new single-plane 2D-3D registration algorithm which requires far less iteration than previous techniques. The new algorithm includes a new multi-modal similarity measure and a novel technique for the analytic calculation of the required gradients. Our experimental results show that, when compared to existing gradient and non-gradient based techniques, the proposed algorithm has a wider range of initial poses for which registration can be achieved and requires significantly fewer iterations to converge to the true 3D position of the anatomical structure.
  • Keywords
    biomechanics; bone; computerised tomography; diagnostic radiography; gradient methods; image registration; medical image processing; orthopaedics; surgery; 2D fluoroscopy; 3D CT data; anatomical structure; ankle joints; bones; gradient-based 2D-3D image registration; image-guided surgery; kinematic analysis; knee joints; multimodal similarity measure; single-plane registration algorithm; Algorithms; Arthrography; Fluoroscopy; Humans; Imaging, Three-Dimensional; Knee Joint; Radiographic Image Enhancement; Radiographic Image Interpretation, Computer-Assisted; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique; Tomography, X-Ray Computed;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
  • Conference_Location
    Minneapolis, MN
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-3296-7
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2009.5335172
  • Filename
    5335172