Title :
A new method to calculate parameters of configurable integrated test model
Author :
Wang, H. ; Yang, D. ; Ng, G. ; Chen, S.-T.
Author_Institution :
TRW, Redondo Beach, CA, USA
Abstract :
A configurable integrated test (CIT) model has been developed for GaAs MMIC (monolithic microwave integrated circuit) manufacturing control. The optimal process/test strategy of a MMIC in the production phase can be predicted from this model. A method using an optimization concept is demonstrated for calculating parameters of the CIT model from process/test history. This method can be used to estimate realistic screening probabilities and hence to predict optimal test strategy accurately. The method is described, and examples of its use are presented.<>
Keywords :
III-V semiconductors; MMIC; gallium arsenide; integrated circuit testing; production testing; CIT model; GaAs; III-V semiconductors; MMIC; configurable integrated test model; manufacturing control; optimization concept; production phase; screening probabilities; test strategy; Circuit testing; Gallium arsenide; Integrated circuit manufacture; Integrated circuit modeling; Integrated circuit testing; MMICs; Microwave integrated circuits; Monolithic integrated circuits; Production; Virtual manufacturing;
Conference_Titel :
Microwave Symposium Digest, 1990., IEEE MTT-S International
Conference_Location :
Dallas, TX
DOI :
10.1109/MWSYM.1990.99658
