• DocumentCode
    2425965
  • Title

    Adaptive test delivers wide range of sophisticated test solutions

  • Author

    Arnold, Keith

  • Author_Institution
    Pintail Technol. Inc., Austin, TX, USA
  • fYear
    2010
  • fDate
    19-22 April 2010
  • Firstpage
    125
  • Lastpage
    125
  • Abstract
    The International Technical Roadmap for Semiconductors (ITRS) first mentioned ¿adaptive test´ in 2007 as a ¿technology of the future.¿ When the ITRS publishes their 2009 edition, a complete subsection of the roadmap for test is devoted to the topic of Adaptive Test. Since Pintail has been delivering commercial adaptive test solutions for nearly 5 years, this paper will present a summary of the wide range of successes already deployed to production. These real examples have been achieved by companies like Texas Instruments, Avago Technologies, Qualcomm and Power Integrations.
  • Keywords
    integrated circuit testing; integrated circuit yield; sampling methods; technological forecasting; International Technical Roadmap for Semiconductors; PCM data; adaptive test; dynamic feed-forward techniques; dynamic yield recovery:; packaged test:; statistical sampling; test time reduction; wafer probe; Circuit testing; Electronic equipment testing; Medical tests; Performance loss; Phase change materials; Production; Semiconductor device testing; USA Councils; Vehicle dynamics; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2010 28th
  • Conference_Location
    Santa Cruz, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4244-6649-8
  • Type

    conf

  • DOI
    10.1109/VTS.2010.5469598
  • Filename
    5469598
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2425965