Title :
Adaptive test delivers wide range of sophisticated test solutions
Author_Institution :
Pintail Technol. Inc., Austin, TX, USA
Abstract :
The International Technical Roadmap for Semiconductors (ITRS) first mentioned ¿adaptive test´ in 2007 as a ¿technology of the future.¿ When the ITRS publishes their 2009 edition, a complete subsection of the roadmap for test is devoted to the topic of Adaptive Test. Since Pintail has been delivering commercial adaptive test solutions for nearly 5 years, this paper will present a summary of the wide range of successes already deployed to production. These real examples have been achieved by companies like Texas Instruments, Avago Technologies, Qualcomm and Power Integrations.
Keywords :
integrated circuit testing; integrated circuit yield; sampling methods; technological forecasting; International Technical Roadmap for Semiconductors; PCM data; adaptive test; dynamic feed-forward techniques; dynamic yield recovery:; packaged test:; statistical sampling; test time reduction; wafer probe; Circuit testing; Electronic equipment testing; Medical tests; Performance loss; Phase change materials; Production; Semiconductor device testing; USA Councils; Vehicle dynamics; Very large scale integration;
Conference_Titel :
VLSI Test Symposium (VTS), 2010 28th
Conference_Location :
Santa Cruz, CA
Print_ISBN :
978-1-4244-6649-8
DOI :
10.1109/VTS.2010.5469598
