Design, analysis, and test of low-power and reliable flexible electronics

Author

Kwang-Ting Cheng ; Tsung-Ching Huang

Author_Institution

Univ. of California, Santa Barbara, CA, USA

fYear

2010

fDate

19-22 April 2010

Firstpage

82

Lastpage

82

Abstract

This talk discusses some recent progress in robust circuit/system design and test of flexible electronics. We will first give an overview of reliability simulation for predicting TFT degradation under bias-stress. A reliability analysis framework, which has successfully analyzed the reliability of an amorphous-silicon (a-Si) TFT scan driver for TFT-LCD displays, will be discussed [1]. We then discuss solutions that can make TFT circuits operable under a lower supply voltage and can equip them with post-fabrication tunability for reliability and performance enhancement. Specifically, we will present a new design style, named Pseudo-CMOS [2], which has been successfully validated in a p-type organic TFT technology [3] as well as in a n-type InGaZnO (IGZO) TFT technology.

Keywords

flexible electronics; integrated circuit design; integrated circuit reliability; low-power electronics; TFT-LCD displays; analysis; flexible electronics; low-power; reliability simulation; robust circuit/system design; Circuit simulation; Circuit testing; Electronic equipment testing; Flexible electronics; Flexible printed circuits; Predictive models; Robustness; System analysis and design; System testing; Thin film transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium (VTS), 2010 28th

Conference_Location

Santa Cruz, CA

ISSN

1093-0167

Print_ISBN

978-1-4244-6649-8

Type

conf

DOI

10.1109/VTS.2010.5469610

Filename

5469610