Title :
Analog-digital design in submicrometric digital CMOS technologies
Author :
Leme, C. Azeredo ; Franca, J.E.
Author_Institution :
Centre of Microsyst., Inst. Superior Tecnico, Lisbon, Portugal
Abstract :
Advanced digital CMOS technologies are poised to become an increasingly important manufacturing platform for mixed analog-digital integrated circuits. This requires that appropriate design methodologies are devised to overcome the main problems facing the design of high performance analog cells. This paper presents an overview of some of those methodologies, giving special emphasis to combined analog and digital circuit solutions for the enhanced performance of the former with little extra cost of the latter. These are discussed in the practical examples of a self-calibrated 300 μW, 40 MHz comparator achieving 1 mV resolution, a full 12-bit MOSFET-only ΔΣ modulator, an alternative ΔΣ modulator architecture with minimized analog content, and finally a low offset I/Q D/A interface system
Keywords :
CMOS integrated circuits; comparators (circuits); digital-analogue conversion; integrated circuit design; mixed analogue-digital integrated circuits; sigma-delta modulation; 12 bit; 300 muW; 40 MHz; MOSFET-only ΔΣ modulator; analog-digital design; delta-sigma modulator architecture; integrated circuits; low offset I/Q D/A interface system; mixed analog-digital ICs; self-calibrated comparator; submicron digital CMOS technologies; Analog-digital conversion; CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS technology; Delta modulation; Design methodology; Digital circuits; Integrated circuit manufacture; Integrated circuit technology; Mixed analog digital integrated circuits;
Conference_Titel :
Circuits and Systems, 1997. ISCAS '97., Proceedings of 1997 IEEE International Symposium on
Print_ISBN :
0-7803-3583-X
DOI :
10.1109/ISCAS.1997.608765
