• DocumentCode
    2426640
  • Title

    Nano-mechanical behavior of low temperature electroplated nano-crystalline Ni films

  • Author

    Chung, C.K. ; Chang, W.T.

  • Author_Institution
    Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • fYear
    2010
  • fDate
    20-23 Jan. 2010
  • Firstpage
    203
  • Lastpage
    206
  • Abstract
    Conventional electroplated Ni films were performed at high temperatures of 45-50°C. In this paper, we have studied the low temperature electroplating i.e. low temperature electroplating of nano-crystalline Ni films and their nano-mechanical property. The deposits were electroplated in potentiostatic mode and the low electrolytic temperature varied from 0 to 20 °C. Grazing incidence X-ray diffractometer was used to examine the polycrystalline phase characteristics and grain size. MTS Nano Indenter with continuous stiffness measurement (CSM) module and Berkovich indenter were employed to characterize the nano-mechanical property of deposits. The experimental results showed that hardness increased with decreasing electrolytic temperature. It might be attributed to the residual compressive stress. Therefore, low temperature electroplating is favorable for the enhancement of Ni deposits hardness.
  • Keywords
    X-ray diffraction; compressive strength; elastic constants; electrolytes; electroplating; grain size; hardness; high-temperature effects; internal stresses; metallic thin films; nanoindentation; nanostructured materials; nickel; Berkovich indenter; MTS nanoindenter; Ni; continuous stiffness measurement module; grain size; grazing incidence X-ray diffractometer; hardness; high temperature effect; low electrolytic temperature; low temperature electroplated nanocrystalline films; nanomechanical behavior; polycrystalline phase; potentiostatic mode; residual compressive stress; temperature 0 degC to 20 degC; temperature 45 degC to 50 degC; Electroplating; Low temperature; Nano-identation; Nickel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
  • Conference_Location
    Xiamen
  • Print_ISBN
    978-1-4244-6543-9
  • Type

    conf

  • DOI
    10.1109/NEMS.2010.5592186
  • Filename
    5592186