DocumentCode :
2426847
Title :
NDE: Current Status and Future Development
Author :
Buckley, M.J. ; Panos, R.M.
fYear :
1976
fDate :
1976
Firstpage :
8
Lastpage :
11
Keywords :
Area measurement; Conferences; Inspection; Laboratories; Manufacturing; Material properties; Materials science and technology; Quality assurance; X-ray detection; X-ray detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1976 Ultrasonics Symposium
Type :
conf
DOI :
10.1109/ULTSYM.1976.196619
Filename :
1533559
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2426847
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