DocumentCode
2426973
Title
[Front cover]
fYear
2010
fDate
19-22 April 2010
Abstract
The following topics are dealt with: delay test; performance test; flexible electronics; test cost reduction; low-power IC test; on-line testing; system testing; and optimization; memory test; RF test; early life failure; ATPG.
Keywords
automatic test pattern generation; delay circuits; flexible electronics; integrated circuit testing; low-power electronics; optimisation; ATPG; RF test; delay test; early life failure; flexible electronics; low-power IC test; memory test; on-line testing; optimization; performance test; system testing; test cost reduction;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2010 28th
Conference_Location
Santa Cruz, CA
ISSN
1093-0167
Print_ISBN
978-1-4244-6649-8
Type
conf
DOI
10.1109/VTS.2010.5469642
Filename
5469642
Link To Document