Abstract :
The following topics are dealt with: delay test; performance test; flexible electronics; test cost reduction; low-power IC test; on-line testing; system testing; and optimization; memory test; RF test; early life failure; ATPG.
Keywords :
automatic test pattern generation; delay circuits; flexible electronics; integrated circuit testing; low-power electronics; optimisation; ATPG; RF test; delay test; early life failure; flexible electronics; low-power IC test; memory test; on-line testing; optimization; performance test; system testing; test cost reduction;
Conference_Titel :
VLSI Test Symposium (VTS), 2010 28th
Conference_Location :
Santa Cruz, CA
Print_ISBN :
978-1-4244-6649-8
DOI :
10.1109/VTS.2010.5469642
