• DocumentCode
    2427600
  • Title

    Simulation and fabrication of pyrex glass drilling using CO2 laser

  • Author

    Lin, S.L. ; Wang, H.Y. ; Chung, C.K.

  • Author_Institution
    Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • fYear
    2010
  • fDate
    20-23 Jan. 2010
  • Firstpage
    333
  • Lastpage
    336
  • Abstract
    The traditional glass drilling using mechanical processing and laser processing in air would produce many kinds of defects such as bugle, debris, crack and scorch. In this paper, we have applied the method of liquid-assisted laser processing (LALP) to reduce the temperature gradient, heat-affect zone region for achieving crack-free glass drilling. At the parameters of laser power 6 W, scanning speed 11.4 mm/s and 5 scanning passes by LALP, the crack-free hole with reduced heat-affect zone can be achieved compared to the traditional laser drilling in air. The alpha-step measured profile showed less bugle around the rim of LALP microstructure whose height was about 0.5-1.5 μm in 0.5-1.0 mm water depth while that in air was 6.9-10.5 μm. The relationship between cutting depth, scanning passes and water depths was studied. The ANSYS software was also used to analyze the temperature distribution and thermal stress field in air and water ambient during glass drilling. The higher temperature gradient in air induced higher stress for crack formation while the smaller temperature gradient in water had the less heat-affect zone range and eliminated the crack during processing.
  • Keywords
    gas lasers; glass; laser beam effects; laser beam machining; thermal stresses; Pyrex glass drilling; alpha step measured profile; carbon dioxide laser; crack free glass drilling; heat affect zone region; liquid assisted laser processing; power 6 W; temperature distribution; temperature gradient; thermal stress field; CO2 Laser; Liquid-Assisted; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
  • Conference_Location
    Xiamen
  • Print_ISBN
    978-1-4244-6543-9
  • Type

    conf

  • DOI
    10.1109/NEMS.2010.5592232
  • Filename
    5592232