• DocumentCode
    2427656
  • Title

    Sensitivity Analysis of a large-scale system dynamics immigration model

  • Author

    Shearer, Nevan ; Khasawneh, Mahmoud ; Zhang, Jun ; Bowling, Shannon ; Rabadi, Ghaith

  • Author_Institution
    Dept. of Eng. Manage. & Syst. Eng., Old Dominion Univ., Norfolk, VA, USA
  • fYear
    2010
  • fDate
    23-23 April 2010
  • Firstpage
    78
  • Lastpage
    81
  • Abstract
    Sensitivity Analysis (SA) is studying the impact of input changes (nature and magnitude) on outputs. Specifically, analysts and decision makers are typically interested in understanding how much output variation is produced, by varying the inputs of a system. The system in this case is a system dynamics computer model and the objective is to perform SA on the Immigration Simulation model that has been developed to support the Secure Border Initiative (SBI). The ultimate objective is to enhance the validity of the Immigration Simulation Model (and possibly other future models) and minimize the risk taken in making decisions based on models´ output. In this paper, a framework is provided for the SA process that was used in analyzing the SBI Immigration Simulation model. This framework consists of the following processes: (1) Input Variables Analysis, (2) Output Variables Analysis, (3) Experimental Design, (4) Model(s) Execution, and (5) Statistical Analysis. The main focus of this paper, however, is the experimental design used to carry out the sensitivity analysis.
  • Keywords
    decision making; sensitivity analysis; social sciences; decision making; dynamics computer model; immigration simulation model; secure border initiative; sensitivity analysis; Computational modeling; Computer simulation; Design engineering; Design for experiments; Input variables; Large-scale systems; Research and development management; Sensitivity analysis; Systems engineering and theory; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems and Information Engineering Design Symposium (SIEDS), 2010 IEEE
  • Conference_Location
    Charlottesville, VA
  • Print_ISBN
    978-1-4244-7519-3
  • Type

    conf

  • DOI
    10.1109/SIEDS.2010.5469677
  • Filename
    5469677