• DocumentCode
    2427778
  • Title

    End region three-dimensional magnetic flux calculation and error influence on small slenderness ratio AC exciter

  • Author

    Xiaohe, Ma ; Jianxun, Li ; Weiwei, Zhang

  • Author_Institution
    Sch. of Electron., Inf. & Electr. Eng., Shanghai Jiao Tong Univ., Shanghai, China
  • fYear
    2009
  • fDate
    17-20 May 2009
  • Firstpage
    2570
  • Lastpage
    2572
  • Abstract
    Traditional state-space equation method can not accurately calculate transient inductances considering of magnetic field saturation and leakage, while two-dimensional finite element method (FEM) is not applicable for small slenderness ratio AC exciter in aeronautic power. Therefore, one end region three-dimension magnetic flux calculation method is proposed. With arbitrary six-node pentahedron structure in local coordinate, three-dimension end region magnetic flux equation is deduced to calculate end armature inductance. Simulations on a certain AC exciter fully prove magnetic leakage can not be ignored if slenderness ratio is below than 0.3. Moreover, it proves that the method is more precise than state-space equation and direct two-dimensional FEM and less time-consuming than direct three-dimension FEM, so it gives good reference for transient inductances analysis especially for smaller slenderness ratio synchronous generator.
  • Keywords
    exciters; finite element analysis; magnetic flux; magnetic leakage; FEM; aeronautic power; end region three-dimensional magnetic flux calculation; finite element method; magnetic field saturation; magnetic leakage; slenderness ratio AC exciter; slenderness ratio synchronous generator; state-space equation method; three-dimension magnetic flux calculation method; transient inductances; Automation; Equations; Finite element methods; Inductance; Magnetic fields; Magnetic flux; Saturation magnetization; Shape; Synchronous generators; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Motion Control Conference, 2009. IPEMC '09. IEEE 6th International
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-3556-2
  • Electronic_ISBN
    978-1-4244-3557-9
  • Type

    conf

  • DOI
    10.1109/IPEMC.2009.5157838
  • Filename
    5157838