DocumentCode
2427831
Title
Real-time control of substrate temperature using band edge thermometry
Author
Johnson, S.R. ; Beaudoin, M. ; Boonzaayer, M. ; Grassi, E. ; Zhang, Y.H.
Author_Institution
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
fYear
2000
fDate
24-28 July 2000
Abstract
The nested loop approach is a convenient way to add an accurate external temperature sensor to the conventional Eurotherm-thermocouple control loop found in molecular beam epitaxy systems. In this case, the outer control loop updates the Eurotherm (thermocouple) setpoint based on the difference between the user setpoint and the value measured by the external sensor, using a proportional-integral-derivative algorithm implemented in control software. This method has the advantage that the Eurotherm-thermocouple control system is left intact, so that, in the event the external sensor or control computer fails, the heater power will continue to be controlled.
Keywords
Molecular beam epitaxial growth; Process control; Semiconductor growth; Spectral methods of temperature measurement; Temperature control; Temperature sensors; Thermocouples; Three-term control; Eurotherm-thermocouple control loop; accurate external temperature sensor; band edge thermometry; control software; diffuse reflectance spectrometry; molecular beam epitaxy systems; nested loop approach; proportional-integral-derivative algorithm; real-time control; substrate temperature control; Control systems; Molecular beam epitaxial growth; Pi control; Proportional control; Software algorithms; Software measurement; Substrates; Temperature control; Temperature sensors; Thermal sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic-Enhanced Optics, Optical Sensing in Semiconductor Manufacturing, Electro-Optics in Space, Broadband Optical Networks, 2000. Digest of the LEOS Summer Topical Meetings
Conference_Location
Aventura, FL, USA
ISSN
1099-4742
Print_ISBN
0-7803-6252-7
Type
conf
DOI
10.1109/LEOSST.2000.869726
Filename
869726
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