• DocumentCode
    2427936
  • Title

    A Quartic Solution Covering Freeze-out and Exhaustion in P-type Compensated Semiconductors

  • Author

    Fenley, Justin ; Pieper, R.

  • Author_Institution
    Dept. of Electr. Eng., Texas Univ., Tyler, TX
  • fYear
    2007
  • fDate
    4-6 March 2007
  • Firstpage
    291
  • Lastpage
    295
  • Abstract
    The local charge neutrality condition for partially compensated P-type doubly-doped uniform equilibrium semiconductors is shown to lead to a quartic polynomial in a Z-parameter that is directly proportional to the concentration of holes. Analysis demonstrates that the problem is solvable exactly by identifying the only physically permissible root to a quartic polynomial. The unique solution for Z leads directly to analytic expressions for temperature dependent majority carrier concentration and the Fermi level.
  • Keywords
    Fermi level; compensation; polynomials; semiconductor doping; Fermi level; Z-parameter; exhaustion effects; freeze-out effects; local charge neutrality condition; partially compensated P-type doubly-doped uniform equilibrium semiconductors; quartic polynomial; temperature dependent majority carrier concentration; Charge carrier processes; Electrons; Equations; FET integrated circuits; Ion implantation; Lead compounds; Network address translation; Polynomials; Semiconductor impurities; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Theory, 2007. SSST '07. Thirty-Ninth Southeastern Symposium on
  • Conference_Location
    Macon, GA
  • ISSN
    0094-2898
  • Print_ISBN
    1-4244-1126-2
  • Electronic_ISBN
    0094-2898
  • Type

    conf

  • DOI
    10.1109/SSST.2007.352368
  • Filename
    4160854