Title : 
A world of opportunities [advertisement]
         
        
        
        
            Abstract : 
Advertisement: IEEE CMPT.
         
        
        
        
            Conference_Titel : 
Semiconductor Thermal Measurement and Management Symposium, 2007. SEMI-THERM 2007. Twenty Third Annual IEEE
         
        
            Conference_Location : 
San Jose, CA
         
        
        
            Print_ISBN : 
1-4244-0958-6
         
        
        
            DOI : 
10.1109/STHERM.2007.352381