Title :
A world of opportunities [advertisement]
Abstract :
Advertisement: IEEE CMPT.
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 2007. SEMI-THERM 2007. Twenty Third Annual IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
1-4244-0958-6
DOI :
10.1109/STHERM.2007.352381