• DocumentCode
    2428339
  • Title

    Simplified path gain model for mobile-to-mobile communications in an urban high-rise environment

  • Author

    Lu, Jonathan S. ; Bertoni, Henry L. ; Chrysanthou, Chrysanthos ; Boksiner, Jeffrey

  • Author_Institution
    Wireless Internet Center for Adv. Technol., Polytech. Inst. of New York Univ., Brooklyn, OH, USA
  • fYear
    2010
  • fDate
    12-14 April 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The goal of this work is to create a short-range urban propagation model to predict small area average path gain for mobile to mobile communications with computer running time on the order of 10 ms per link. To achieve such short computation time for a high-rise urban environment, only significant ray paths which travel in the horizontal plane (HP) are considered. The path gain for line of sight (LOS) receiving and transmitting antenna orientation is modeled with the 2-Ray model. For Non-Line of Sight (NLOS) orientations, the dominant ray paths are ray paths that diffract at building corners in the horizontal plane. To compute the contribution to path gain from these diffracted ray paths, approximations on the 2-Ray model and the Geometric Theory of Diffraction (GTD) are utilized. This urban propagation model was validated against empirical models and measurements taken in San Francisco, Boston, Philadelphia, and Manhattan.
  • Keywords
    mobile communication; receiving antennas; transmitting antennas; 2-Ray model; Boston; Manhattan; Philadelphia; San Francisco; geometric theory of diffraction; line of sight; mobile-to-mobile communications; receiving antenna; short-range urban propagation model; simplified path gain model; time 10 ms; transmitting antenna; urban high-rise environment; Computer vision; Frequency; Gain measurement; Internet; Military computing; Mobile communication; Mobile computing; Physical theory of diffraction; Predictive models; Solid modeling; 2-Ray; GTD; M2N; diffraction; path gain; prediction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sarnoff Symposium, 2010 IEEE
  • Conference_Location
    Princeton, NJ
  • Print_ISBN
    978-1-4244-5592-8
  • Type

    conf

  • DOI
    10.1109/SARNOF.2010.5469712
  • Filename
    5469712