• DocumentCode
    2428567
  • Title

    Chip level signal integrity analysis and crosstalk prediction using artificial neural nets

  • Author

    Ilumoka, A.

  • Author_Institution
    Dept. of Electr. Eng., Hartford Univ., West Hartford, CT, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    175
  • Lastpage
    180
  • Abstract
    Recent ITRS predictions indicate that by the year 2011, the billion transistor monolithic die will be a reality. This clearly poses a challenge to gigascale integrated circuit design with regard to provision of multilevel interconnect wiring for the distribution of power, data and control signals to all parts of a chip. This paper addresses the problem of characterization, modeling and verification of 3D chip level interconnect crosstalk. The novel methodology proposed involves topological decomposition of interconnects into standard cells and the creation of parameterized models of these primitive structures using neural networks. Experimental results from a high performance operational amplifier demonstrates the viability of the approach.
  • Keywords
    circuit analysis computing; crosstalk; integrated circuit interconnections; integrated circuit modelling; network topology; neural nets; operational amplifiers; power supply circuits; 3D chip level interconnect crosstalk; ITRS predictions; artificial neural nets; billion transistor monolithic die; chip level crosstalk prediction; chip level signal integrity analysis; control signal distribution; data signal distribution; gigascale integrated circuit design; interconnect topological decomposition; modeling; multilevel interconnect wiring; neural networks; operational amplifier; parameterized models; power signal distribution; standard cells; Artificial neural networks; Coupling circuits; Crosstalk; Distributed parameter circuits; Integrated circuit interconnections; Neural networks; Power transmission lines; Signal analysis; Timing; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2002. Proceedings. International Symposium on
  • Print_ISBN
    0-7695-1561-4
  • Type

    conf

  • DOI
    10.1109/ISQED.2002.996725
  • Filename
    996725