Title :
Reliability and precision increase of amplitude-temporal transformers of build-in microelectroelectronic systems
Author :
Ivanciv, Roman ; Lobur, Mykhaylo
Author_Institution :
CAD/CAM Dept., Lviv Polytech. Nat. Univ., Ukraine
Abstract :
Traditional reliability rise method is reserving of apparatus. Reserving can be "cold" or "hot". In both cases there must be an arbiter (device or operator), which determines a technical apparatus state, chooses a most workable channel out of the reserved ones and includes this channel. Such methodology of reliability rise produces the tangible results, but has some peculiarities. The intervention of arbiter is also necessary at faults, and there will be momentary function execution break with reserved device at reserve switching.
Keywords :
digital voltmeters; fault tolerance; mechatronics; potential transformers; amplitude-temporal transformers; build-in microelectroelectronic systems; enumerated faults; fault tolerance; impulse voltmeter; logic reserving; precision increase; reliability increase; reserve switching; time-digit transformer; CADCAM; Circuit faults; Computer aided manufacturing; Earth; Fault tolerant systems; Logic devices; Microelectronics; Rockets; Satellites; Transformers;
Conference_Titel :
CAD Systems in Microelectronics, 2003. CADSM 2003. Proceedings of the 7th International Conference. The Experience of Designing and Application of
Print_ISBN :
966-553-278-2
DOI :
10.1109/CADSM.2003.1255164
